ICSPI – Redux AFM
Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.
- Precise: Quantitative 3D data with sub-nanometer precision
- Automated: Motorized X, Y and Z stages for easy sample navigation
- High throughput: Go from sample loading to data in minutes
- Versatile: Topography, roughness, thickness, particle size and more
Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.