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  • Malvern Panalytical - Spectroscopy - Zetium

    Malvern Panalytical – Spectroscopy – Zetium

    X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer…

    X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am.

    Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in materials analysis. The platform embodies SumXcore technology – an integration of WDXRF, EDXRF and XRD. This unique combination of possibilities puts Zetium in a class of its own with respect to analytical power, speed and task flexibility in multiple environments.

    DKSH is the exclusive distributor in Cambodia, Laos, Malaysia, Myanmar, Philippines, Thailand and Vietnam.

  • Malvern Panalytical - X-Ray Diffractometer (XRD) - X'Pert³ Powder

    Malvern Panalytical – X-Ray Diffractometer (XRD) – X’Pert³ Powder

    The next generation cost-effective, multipurpose X-ray diffraction platform

    X’Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform. With new on-board control electronics, comp…

    The next generation cost-effective, multipurpose X-ray diffraction platform

    X’Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X’Pert³ Powder is ready for the future. The system offers an affordable solution for high-throughput, high-quality phase identification and quantification, residual stress analysis, grazing incidence diffraction, X-ray reflectometry, small-angle X-ray scattering, pair distribution function analysis and non-ambient diffraction.

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